Bond Quality - The quest for 1ppm …..
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NEW 100% Bond quality monitoring

H&K have developed an industrialized method – referred to as PIQC – for  real time measurement and numerical analysis that generates quality figure of merit proven to be in line with interofemetric techniques.   This solution is based on the H&K wirebonding solution – exploiting the highly sensitive drive and control signals, and adding dedicated sensors for the capture of the ultrasonic effects. The solution has undergone pilot industrialization programs in 2006/7, and was formerly launched November 2007.

 

Pour plus d'information consultez la page Hesse & Knipps 

 
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Plasma process for improved band quality

In processes in which contamination is an issue, contaminant removal is possible through a process of physical or chemical plasma cleaning.
Process gases are selected as a function of the type of contamination (Ar for inorganic, and Oxygen for organique and Hydrogen for organic contamination on oxidizing surfaces.  Mixture of these materials with Helium, Azote or Nitgrogen  are also used.

The plasma effect and its efficiency to clean is adapted by the plasma variables: gas density; RF power; RF frequency and plasma exposure time.  There will be a “sweet spot” in the optimization parameters which achieve the best cleaning effectiveness which can only be found be empirical techniques.

Pour plus d'information consultez la page March Plasma

 

Geotest

nouvelle carte PXI Flex DIO FPGA

La carte FPGA 3U PXI est configurable par l'utilisateur et comporte 160 entrées/sorties pour signaux numériques destinés aux besoins d'applications spécifiques. La nouvelle carte GX3500 utilise le circuit intégré programmable Altera Cyclone III, qui supporte des fréquences de base jusqu'à 150 MHz.

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